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On the Thermal Models for Resistive Random Access Memory Ci..:
Roldán, Juan B
;
González-Cordero, Gerardo
;
Picos, Rodrigo
...
Agencia Estatal de Investigación TEC2017-84321-C4-3-R. , 2021
Link:
https://ddd.uab.cat/record/255630
RT Journal T1
On the Thermal Models for Resistive Random Access Memory Circuit Simulation
UL https://suche.suub.uni-bremen.de/peid=base-ftuabarcelonapb:oai:ddd.uab.cat:255630&Exemplar=1&LAN=DE A1 Roldán, Juan B A1 González-Cordero, Gerardo A1 Picos, Rodrigo A1 Miranda, Enrique A1 Palumbo, Félix A1 Jiménez-Molinos, Francisco A1 Moreno Pérez, Enrique A1 Maldonado, David A1 Baldomá, Santiago B A1 Moner Al Chawa, Mohamad A1 de Benito, Carol A1 Stavrinides, Stavros G A1 Suñé, Jordi A1 Chua, Leon O YR 2021 K1 Resistive memories K1 Thermal model K1 Heat equation K1 Thermal conductivity K1 Circuit simulation K1 Compact modeling K1 Resistive switching K1 Nanodevices JF Agencia Estatal de Investigación TEC2017-84321-C4-3-R LK http://dx.doi.org/https://ddd.uab.cat/record/255630 DO https://ddd.uab.cat/record/255630 SF ELIB - SuUB Bremen
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