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1 Ergebnisse
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Nanometer-scale oxidation of Si(100) surfaces by tapping mo..:
Pérez Murano, Francesc
;
Abadal, G
;
Barniol i Beumala, Núria
...
Reproducció del document publicat a: http://dx.doi.org/10.1063/1.360505. , 1995
Link:
http://hdl.handle.net/2445/24743
RT Journal T1
Nanometer-scale oxidation of Si(100) surfaces by tapping mode atomic force microscopy
UL https://suche.suub.uni-bremen.de/peid=base-ftubarcepubl:oai:diposit.ub.edu:2445_24743&Exemplar=1&LAN=DE A1 Pérez Murano, Francesc A1 Abadal, G A1 Barniol i Beumala, Núria A1 Aymerich Humet, Xavier A1 Servat, J A1 Gorostiza Langa, Pablo Ignacio A1 Sanz Carrasco, Fausto PB American Institute of Physics YR 1995 K1 Microscòpia de força atòmica K1 Silici K1 Nanoelectrònica K1 Detectors K1 Camps elèctrics K1 Atomic force microscopy K1 Silicon K1 Nanoelectronics K1 Electric fields JF Reproducció del document publicat a: http://dx.doi.org/10.1063/1.360505 LK http://hdl.handle.net/2445/24743 DO http://hdl.handle.net/2445/24743 SF ELIB - SuUB Bremen
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