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Kelvin probe measurements of microcrystalline silicon on a ..:
Breymesser, A
;
Schlosser, V
;
Peiró, D
...
Versió postprint del document publicat a: http://dx.doi.org/10.1016/S0927-0248(00)00170-7. , 2001
Link:
http://hdl.handle.net/2445/98399
RT Journal T1 <Title>Kelvin probe measurements of microcrystalline silicon on a nanometer scale using SFM</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftubarcepubl:oai:diposit.ub.edu:2445_98399&Exemplar=1&LAN=DE A1 Breymesser, A A1 Schlosser, V A1 Peiró, D A1 Voz Sánchez, Cristóbal A1 Bertomeu i Balagueró, Joan A1 Andreu i Batallé, Jordi A1 Summhammer, J PB Elsevier B.V. YR 2001 K1 Silici K1 Deposició química en fase vapor K1 Cèl·lules solars K1 Silicon K1 Chemical vapor deposition K1 Solar cells JF Versió postprint del document publicat a: http://dx.doi.org/10.1016/S0927-0248(00)00170-7 LK http://hdl.handle.net/2445/98399 DO http://hdl.handle.net/2445/98399 SF ELIB - SuUB Bremen
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