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1 Ergebnisse
1
High resolution wheat yield mapping using Sentinel-2:
Hunt, Merryn
;
Blackburn, Alan
;
Carrasco, Luis
..
https://eprints.lancs.ac.uk/id/eprint/136586/2/Author_Accepted_Manuscript.pdf. , 2019
Link:
https://eprints.lancs.ac.uk/id/eprint/136586/
RT Journal T1 <Title>High resolution wheat yield mapping using Sentinel-2</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftulancaster:oai:eprints.lancs.ac.uk:136586&Exemplar=1&LAN=DE A1 Hunt, Merryn A1 Blackburn, Alan A1 Carrasco, Luis A1 Redhead, John W A1 Rowland, Clare S YR 2019 JF https://eprints.lancs.ac.uk/id/eprint/136586/2/Author_Accepted_Manuscript.pdf LK http://dx.doi.org/https://eprints.lancs.ac.uk/id/eprint/136586/ DO https://eprints.lancs.ac.uk/id/eprint/136586/ SF ELIB - SuUB Bremen
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