Titel

Merkliste
1 Ergebnisse

Composition measurement of epitaxial ScxGa1-xN films:

Tsui, H. C. L ; Goff, L. E ; Barradas, N. P...
Tsui , H C L , Goff , L E , Barradas , N P , Alves , E , Pereira , S , Palgrave , R G , Davies , R J , Beere , H E , Farrer , I , Ritchie , D A & Moram , M A 2016 , ' Composition measurement of epitaxial ScxGa1-xN films ' , Semiconductor Science and Technology , vol. 31 , no. 6 , 064002 . https://doi.org/10.1088/0268-1242/31/6/064002. , 2016

Link: https://research.manchester.ac.uk/en/publications/0962..

RT Journal
T1 <Title>Composition measurement of epitaxial ScxGa1-xN films</Title>

UL https://suche.suub.uni-bremen.de/peid=base-ftumanchesterpub:oai:pure.atira.dk:publications_09620b4b-e1e0-478e-b5d2-b46ae9f7fa39&Exemplar=1&LAN=DE
				
A1 Tsui, H. C. L
A1 Goff, L. E
A1 Barradas, N. P
A1 Alves, E
A1 Pereira, S
A1 Palgrave, R. G
A1 Davies, R. J
A1 Beere, H. E
A1 Farrer, I
A1 Ritchie, D. A
A1 Moram, M. A
YR 2016
K1 ScGaN
K1 Rutherford backscattering
K1 x-ray photoelectron spectroscopy
K1 composition measurement
JF Tsui , H C L , Goff , L E , Barradas , N P , Alves , E , Pereira , S , Palgrave , R G , Davies , R J , Beere , H E , Farrer , I , Ritchie , D A & Moram , M A 2016 , ' Composition measurement of epitaxial ScxGa1-xN films ' , Semiconductor Science and Technology , vol. 31 , no. 6 , 064002 . https://doi.org/10.1088/0268-1242/31/6/064002
LK http://dx.doi.org/https://research.manchester.ac.uk/en/publications/09620b4b-e1e0-478e-b5d2-b46ae9f7fa39
DO https://research.manchester.ac.uk/en/publications/09620b4b-e1e0-478e-b5d2-b46ae9f7fa39
SF ELIB - SuUB Bremen

Export

RefWorks (nur Desktop-Version!)
Flow (Zuerst in Flow einloggen, dann importieren)