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Towards in-process x-ray CT for dimensional metrology:

Warnett, Jason M ; Titarenko, Valeriy ; Kiraci, Ercihan...
Warnett , J M , Titarenko , V , Kiraci , E , Attridge , A , Lionheart , W R B , Withers , P J & Williams , M A 2016 , ' Towards in-process x-ray CT for dimensional metrology ' , Measurement Science and Technology , vol. 27 , no. 3 , 035401 . https://doi.org/10.1088/0957-0233/27/3/035401.  , 2016