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1 Ergebnisse
1
Modeling and correction of image pixel hysteresis in atomic..:
Sun, Baishun
;
Cao, Liang
;
Xie, Chenchen
...
https://www.sciencedirect.com/science/article/abs/pii/S0304399119303444. , 2020
Link:
http://hdl.handle.net/10547/624389
RT Journal T1 <Title>Modeling and correction of image pixel hysteresis in atomic force microscopy</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunbedfordshire:oai:uobrep.openrepository.com:10547_624389&Exemplar=1&LAN=DE A1 Sun, Baishun A1 Cao, Liang A1 Xie, Chenchen A1 Song, Zhengxun A1 Lu, Zhengcheng A1 Weng, Zhankun A1 Wang, Zuobin PB Elsevier B.V. YR 2020 K1 measurement accuracy K1 atomic force microscopy K1 image pixel hysteresis model JF https://www.sciencedirect.com/science/article/abs/pii/S0304399119303444 LK http://hdl.handle.net/10547/624389 DO http://hdl.handle.net/10547/624389 SF ELIB - SuUB Bremen
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