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1 Ergebnisse
1
Tapping atomic force microscopy imaging at phase resonance:
Sun, Baishun
;
Xie, Chenchen
;
Qu, Kaige
...
https://ieeexplore.ieee.org/document/9599767. , 2022
Link:
http://hdl.handle.net/10547/625346
RT Journal T1
Tapping atomic force microscopy imaging at phase resonance
UL https://suche.suub.uni-bremen.de/peid=base-ftunbedfordshire:oai:uobrep.openrepository.com:10547_625346&Exemplar=1&LAN=DE A1 Sun, Baishun A1 Xie, Chenchen A1 Qu, Kaige A1 Cao, Liang A1 Yan, Jin A1 Wang, Ying A1 Tian, Liguo A1 Zhang, Wenxiao A1 Wang, Zuobin PB IEEE YR 2022 K1 PR-AFM K1 atomic force acoustic microscopy K1 soft samples K1 soft micronanomaterials K1 sample properties K1 scanning imaging K1 phase sensitivity K1 first-order resonance K1 phase resonance peak K1 probe vibration K1 imaging quality K1 TM-AFM phase image K1 phase resonance-atomic force microscope K1 Subject Categories::J900 Others in Technology JF https://ieeexplore.ieee.org/document/9599767 LK http://hdl.handle.net/10547/625346 DO http://hdl.handle.net/10547/625346 SF ELIB - SuUB Bremen
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