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1 Ergebnisse
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Early fault detection in SiC-MOSFET with application in boo..:
Hernández-González, Leobardo
;
Arvizu-Ogilvie, Climaco
;
Tapia-Hernández, Alejandro
...
https://revistas.udea.edu.co/index.php/ingenieria/article/view/327615/20788276. , 2018
Link:
https://revistas.udea.edu.co/index.php/ingenieria/arti..
RT Journal T1
Early fault detection in SiC-MOSFET with application in boost converter ; Detección de fallas en SiC-Mosfet con aplicación en un convertidor elevador
UL https://suche.suub.uni-bremen.de/peid=base-ftuniantioqojs:oai:ojs.pkp.sfu.ca:article_327615&Exemplar=1&LAN=DE A1 Hernández-González, Leobardo A1 Arvizu-Ogilvie, Climaco A1 Tapia-Hernández, Alejandro A1 Ponce-Silva, Mario A1 Claudio-Sánchez, Abraham A1 Rodríguez-Blanco, Marco A1 Aguayo-Alquicira, Jesús PB Universidad de Antioquia YR 2018 K1 semiconductor K1 silicon carbide K1 fault-detection K1 carburo desilicio K1 detección de fallas JF https://revistas.udea.edu.co/index.php/ingenieria/article/view/327615/20788276 LK http://dx.doi.org/https://revistas.udea.edu.co/index.php/ingenieria/article/view/327615 DO https://revistas.udea.edu.co/index.php/ingenieria/article/view/327615 SF ELIB - SuUB Bremen
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