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1 Ergebnisse
1
Ultra-fast CV methods (< 10µs) for interface trap spectrosc..:
Mota Frutuoso, Tadeu
;
Garros, Xavier
;
Lugo-Alvarez, José
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS48227.2022.9764550. , 2022
Link:
https://hal.science/hal-04065065
RT Journal T1 <Title>Ultra-fast CV methods (< 10µs) for interface trap spectroscopy and BTI reliability characterization using MOS capacitors</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunigrenoble:oai:HAL:hal-04065065v1&Exemplar=1&LAN=DE A1 Mota Frutuoso, Tadeu A1 Garros, Xavier A1 Lugo-Alvarez, José A1 Kom Kammeugne, Roméo A1 Mohgouk Zouknak, Louis David A1 Viey, Abygaël A1 Vandendaele, William A1 Ferrari, Philippe A1 Gaillard, Fred PB HAL CCSD; IEEE YR 2022 K1 aging K1 CMOS technology K1 DIT K1 High-k Oxide K1 semiconductor device reliability K1 PACS 85.42 K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS48227.2022.9764550 LK http://dx.doi.org/https://hal.science/hal-04065065 DO https://hal.science/hal-04065065 SF ELIB - SuUB Bremen
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