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Novel pseudo-MOSFET methods for the characterization of adv..:
Diab, Amer El Hajj, El Hajj Diab
NNT: 2012GRENT060. , 2012
Link:
https://theses.hal.science/tel-00796613
RT Journal T1
Novel pseudo-MOSFET methods for the characterization of advanced SOI substrates ; Nouvelles méthodes pseudo-MOSFET pour la caractérisation des substrats SOI avancés
UL https://suche.suub.uni-bremen.de/peid=base-ftunigrenoble:oai:HAL:tel-00796613v1&Exemplar=1&LAN=DE A1 Diab, Amer El Hajj, El Hajj Diab PB HAL CCSD YR 2012 K1 Silicon-On-Insulator K1 MOSFET (Pseudo-MOSFET) K1 Smart-CutTM K1 Split C-V K1 Low-frequency noise K1 Low-temperature K1 Heavily doped SOI K1 SiGe NWs K1 Gold nanoparticles K1 Silicium-Sur-Isolant K1 Bruit basse fréquence K1 Basse température K1 SOI fortement dopé K1 Nanofils SiGe K1 Nanoparticules d'or K1 [SPI.OTHER]Engineering Sciences [physics]/Other JF NNT: 2012GRENT060 LK http://dx.doi.org/https://theses.hal.science/tel-00796613 DO https://theses.hal.science/tel-00796613 SF ELIB - SuUB Bremen
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