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Thorough electrical characterization of the mechanisms cont..:
Kom Kammeugne, Roméo
NNT: 2022GRALT039. , 2022
Link:
https://theses.hal.science/tel-03828057
RT Journal T1
Thorough electrical characterization of the mechanisms controlling GaN-on-Si MIS-HEMT devices performances ; Caractérisation électrique approfondie des mécanismes contrôlant les performances des transistors MIS-HEMT GaN sur silicium
UL https://suche.suub.uni-bremen.de/peid=base-ftunigrenoble:oai:HAL:tel-03828057v1&Exemplar=1&LAN=DE A1 Kom Kammeugne, Roméo PB HAL CCSD YR 2022 K1 Electrical Characterization K1 Mis-Hemt K1 Modelling K1 Gallium nitride (GaN) K1 Traps K1 Low frequency noise (LFN) K1 Caractérisation électrique K1 Modélisation K1 Nitrure de gallium (GaN) K1 Pièges K1 Bruit basse fréquence (LFN) K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF NNT: 2022GRALT039 LK http://dx.doi.org/https://theses.hal.science/tel-03828057 DO https://theses.hal.science/tel-03828057 SF ELIB - SuUB Bremen
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