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1 Ergebnisse
1
Study of atomic-scale defects in graphene and related mater..:
Sharma, Kshipra
NNT: 2023GRALT053. , 2023
Link:
https://theses.hal.science/tel-04330994
RT Journal T1
Study of atomic-scale defects in graphene and related materials by advanced transmission electron microscopy techniques ; Étude des défauts à l'échelle atomique du graphène et des matériaux associés par des techniques avancées de microscopie électronique à transmission
UL https://suche.suub.uni-bremen.de/peid=base-ftunigrenoble:oai:HAL:tel-04330994v1&Exemplar=1&LAN=DE A1 Sharma, Kshipra PB HAL CCSD YR 2023 K1 2D materials K1 Atomic defects K1 Plasma induced defects formation in graphene K1 Aberration-Corrected transmission electron microscopy K1 Nanopores in graphene for surface-Based applications K1 4-Dimensional STEM K1 Matériel 2D K1 Defauts atomiques K1 Formation de défauts induite par plasma dans le graphène K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF NNT: 2023GRALT053 LK http://dx.doi.org/https://theses.hal.science/tel-04330994 DO https://theses.hal.science/tel-04330994 SF ELIB - SuUB Bremen
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