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Wavefront metrology for coherent hard X-rays by scanning a ..:
Skjonsfjell, Eirik Torbjorn Bakken
;
Chushkin, Yuriy
;
Zontone, Federico
...
info:eu-repo/semantics/altIdentifier/doi/10.1364/OE.24.010710. , 2016
Link:
https://hal.science/hal-01572884
RT Journal T1
Wavefront metrology for coherent hard X-rays by scanning a microsphere
UL https://suche.suub.uni-bremen.de/peid=base-ftunimainelemans:oai:HAL:hal-01572884v1&Exemplar=1&LAN=DE A1 Skjonsfjell, Eirik Torbjorn Bakken A1 Chushkin, Yuriy A1 Zontone, Federico A1 Patil, Nilesh A1 Gibaud, Alain A1 Breiby, Dag W PB HAL CCSD; Optical Society of America - OSA Publishing YR 2016 K1 [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics] JF info:eu-repo/semantics/altIdentifier/doi/10.1364/OE.24.010710 LK http://dx.doi.org/https://hal.science/hal-01572884 DO https://hal.science/hal-01572884 SF ELIB - SuUB Bremen
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