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Electronic and Chemical Properties of Nickel Oxide Thin Fil..:
Poulain, Raphaël
;
Lumbeeck, Gunnar
;
Hunka, Jonas
...
info:eu-repo/grantAgreement/European Union's Horizon 2020/Research and Innovation Programme/Grant Agreement No. 641640 (EJD-ITN, project FunMAT). , 2022
Link:
http://hdl.handle.net/2078.1/264493
RT Journal T1 <Title>Electronic and Chemical Properties of Nickel Oxide Thin Films and the Intrinsic Defects Compensation Mechanism</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunistlouisbrus:oai:dial.uclouvain.be:boreal:264493&Exemplar=1&LAN=DE A1 Poulain, Raphaël A1 Lumbeeck, Gunnar A1 Hunka, Jonas A1 Proost, Joris A1 Savolainen, Henri A1 Idrissi, Hosni A1 Schryvers, Dominique A1 Gauquelin, Nicolas A1 Klein, Andreas PB American Chemical Society (ACS) YR 2022 K1 Nickel oxide K1 Defects compensation K1 Conductivity K1 Grain boundaries K1 Fermi level K1 Photoelectron spectroscopy JF info:eu-repo/grantAgreement/European Union's Horizon 2020/Research and Innovation Programme/Grant Agreement No. 641640 (EJD-ITN, project FunMAT) LK http://hdl.handle.net/2078.1/264493 DO http://hdl.handle.net/2078.1/264493 SF ELIB - SuUB Bremen
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