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1 Ergebnisse
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Ion-assisted gate recess process induced damage in GaN chan..:
Ferrandis, Philippe
;
Charles, Matthew
;
Baines, Yannick
...
info:eu-repo/semantics/altIdentifier/doi/10.7567/JJAP.56.04CG01. , 2017
Link:
https://hal.science/hal-01692619
RT Journal T1
Ion-assisted gate recess process induced damage in GaN channel of AlGaN/GaN Schottky barrier diodes studied by deep level transient spectroscopy
UL https://suche.suub.uni-bremen.de/peid=base-ftunivaixmarseil:oai:HAL:hal-01692619v1&Exemplar=1&LAN=DE A1 Ferrandis, Philippe A1 Charles, Matthew A1 Baines, Yannick A1 Buckley, Julien A1 Garnier, Gennie A1 Gillot, Charlotte A1 Reimbold, Gilles PB HAL CCSD; Japan Society of Applied Physics YR 2017 K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics K1 [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci] JF info:eu-repo/semantics/altIdentifier/doi/10.7567/JJAP.56.04CG01 LK http://dx.doi.org/https://hal.science/hal-01692619 DO https://hal.science/hal-01692619 SF ELIB - SuUB Bremen
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