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1 Ergebnisse
1
40nm SONOS Embedded Select in Trench Memory:
Habhab, Radouane
;
Della Marca, Vincenzo
;
Masson, Pascal
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ESSDERC59256.2023.10268472. , 2023
Link:
https://amu.hal.science/hal-04527190
RT Journal T1 <Title>40nm SONOS Embedded Select in Trench Memory</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivaixmarseil:oai:HAL:hal-04527190v1&Exemplar=1&LAN=DE A1 Habhab, Radouane A1 Della Marca, Vincenzo A1 Masson, Pascal A1 Miridi, Nadia A1 Pribat, Clement A1 Jeannot, Simon A1 Kempf, Thibault A1 Mantelli, Marc A1 Lorenzini, Philippe A1 Voisin, Jean-Marc A1 Regnier, Arnaud A1 Niel, Stephan A1 La-Rosa, Francesco PB HAL CCSD; IEEE YR 2023 K1 SiN-based memory K1 charge trapping mechanisms K1 SONOS K1 Hot carrier injection K1 [SPI]Engineering Sciences [physics] K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF info:eu-repo/semantics/altIdentifier/doi/10.1109/ESSDERC59256.2023.10268472 LK http://dx.doi.org/https://amu.hal.science/hal-04527190 DO https://amu.hal.science/hal-04527190 SF ELIB - SuUB Bremen
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