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1 Ergebnisse
1
Mapping electron beam injected trapped charge with scatteri..:
Tranca, Denis E
;
Sánchez Ortiga, Emilio
;
Saavedra Tortosa, Genaro
...
Optics Letters, 2016, vol. 41, num. 5, p. 1046-1049. , 2017
Link:
http://hdl.handle.net/10550/58655
RT Journal T1
Mapping electron beam injected trapped charge with scattering scanning near-field optical microscopy
UL https://suche.suub.uni-bremen.de/peid=base-ftunivalencia:oai:roderic.uv.es:10550_58655&Exemplar=1&LAN=DE A1 Tranca, Denis E A1 Sánchez Ortiga, Emilio A1 Saavedra Tortosa, Genaro A1 Martínez Corral, Manuel A1 Tofail, Syed A.M A1 Stanciu, Stefan G A1 Hristu, Radu A1 Stanciu, George A YR 2017 K1 Òptica Aparells i instruments K1 Microscòpia JF Optics Letters, 2016, vol. 41, num. 5, p. 1046-1049 LK http://hdl.handle.net/10550/58655 DO http://hdl.handle.net/10550/58655 SF ELIB - SuUB Bremen
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