I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Performance improvement with non-alloyed ohmic contacts tec..:
Lesecq, Marie
;
Fouzi, Yassine
;
Abboud, Ali
...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.mee.2023.111998. , 2023
Link:
https://hal.science/hal-04084512
RT Journal T1
Performance improvement with non-alloyed ohmic contacts technology on AlGaN/GaN High Electron Mobility Transistors on 6H-SiC substrate
UL https://suche.suub.uni-bremen.de/peid=base-ftunivclille:oai:HAL:hal-04084512v1&Exemplar=1&LAN=DE A1 Lesecq, Marie A1 Fouzi, Yassine A1 Abboud, Ali A1 Defrance, N A1 Vaurette, Francois A1 Ouendi, Saliha A1 Okada, Etienne A1 Portail, Marc A1 Bah, Micka A1 Alquier, Daniel A1 de Jaeger, Jean-Claude A1 Frayssinet, Eric A1 Cordier, Yvon PB HAL CCSD; Elsevier YR 2023 K1 HEMT K1 GaN K1 Regrown ohmic contacts K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF info:eu-repo/semantics/altIdentifier/doi/10.1016/j.mee.2023.111998 LK http://dx.doi.org/https://hal.science/hal-04084512 DO https://hal.science/hal-04084512 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)