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1 Ergebnisse
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Scrutinizing pre- and post-device fabrication properties of..:
Coleman, Emma
;
Monaghan, Scott
;
Gity, Farzan
...
info:eu-repo/grantAgreement/EC/H2020::RIA/871130/EU/Access to European Infrastructure for Nanoelectronics/ASCENTPlus. , 2023
Link:
https://hdl.handle.net/10468/14876
RT Journal T1 <Title>Scrutinizing pre- and post-device fabrication properties of atomic layer deposition WS2 thin films</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivcollcork:oai:cora.ucc.ie:10468_14876&Exemplar=1&LAN=DE A1 Coleman, Emma A1 Monaghan, Scott A1 Gity, Farzan A1 Mirabelli, Gioele A1 Duffy, Ray A1 Sheehan, Brendan A1 Balasubramanyam, Shashank A1 Bol, Ageeth A A1 Hurley, Paul K PB AIP Publishing YR 2023 K1 Hall effect K1 Electrical properties and parameters K1 Electric measurements K1 Materials heat treatment K1 Atomic force microscopy K1 Atomic layer deposition K1 Metal deposition K1 Thin films K1 Transmission electron microscopy JF info:eu-repo/grantAgreement/EC/H2020::RIA/871130/EU/Access to European Infrastructure for Nanoelectronics/ASCENTPlus LK http://dx.doi.org/https://hdl.handle.net/10468/14876 DO https://hdl.handle.net/10468/14876 SF ELIB - SuUB Bremen
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