Benedikt, J ; Agarwal, S ; Eijkman, D.J...
Benedikt , J , Agarwal , S , Eijkman , D J , Vandamme , W N J , Creatore , M & Sanden, van de , M C M 2005 , ' Threshold ionization mass spectrometry of reactive species in remote Ar/C2H2 expanding thermal plasma ' , Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films , vol. 23 , no. 5 , pp. 1400-1412 . https://doi.org/10.1116/1.2006138.  , 2005