I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Evaluation of single event upset susceptibility of FinFET-b..:
Copetti, Thiago Santos
;
Medeiros, Guilherme Cardoso
;
Taouil, Mottaqiallah
...
Journal of electronic testing : theory and applications. Dordrecht : Kluwer. Vol. 37 (2021), p. 383-394. , 2021
Link:
http://hdl.handle.net/10183/256500
RT Journal T1 <Title>Evaluation of single event upset susceptibility of FinFET-based SRAMs with weak resistive defects</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivfrgs:oai:www.lume.ufrgs.br:10183_256500&Exemplar=1&LAN=DE A1 Copetti, Thiago Santos A1 Medeiros, Guilherme Cardoso A1 Taouil, Mottaqiallah A1 Hamdioui, Said A1 Poehls, Leticia Maria Bolzani A1 Balen, Tiago Roberto YR 2021 K1 Microeletrônica K1 Memória (Informática) K1 Detecção de falhas K1 SRAMs K1 FinFET K1 Resistive defects K1 TCAD K1 SEU K1 Reliability K1 Single event transient modeling JF Journal of electronic testing : theory and applications. Dordrecht : Kluwer. Vol. 37 (2021), p. 383-394 LK http://hdl.handle.net/10183/256500 DO http://hdl.handle.net/10183/256500 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
