I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Mechanical strain and damage in Si implanted with O and N i..:
Souza, Joel Pereira de
;
Suprun-Belevich, Yu
;
Boudinov, Henri Ivanov
.
Journal of applied physics. Melville. Vol. 89, no. 1 (Jan. 2001), p. 42-46. , 2001
Link:
http://hdl.handle.net/10183/95809
RT Journal T1
Mechanical strain and damage in Si implanted with O and N ions at elevated temperatures : evidence of ion beam induced annealing
UL https://suche.suub.uni-bremen.de/peid=base-ftunivfrgs:oai:www.lume.ufrgs.br:10183_95809&Exemplar=1&LAN=DE A1 Souza, Joel Pereira de A1 Suprun-Belevich, Yu A1 Boudinov, Henri Ivanov A1 Cima, Carlos Alberto YR 2001 K1 Recozimento K1 Semicondutores elementares K1 Defeitos de Frenkel K1 Tensões internas K1 Difração de raios X K1 Silício K1 Implantacao ionica K1 Nitrogênio K1 Oxigênio K1 Retroespalhamento rutherford K1 Dopagem de semicondutores JF Journal of applied physics. Melville. Vol. 89, no. 1 (Jan. 2001), p. 42-46 LK http://hdl.handle.net/10183/95809 DO http://hdl.handle.net/10183/95809 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)