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Automatic Extraction of Measurement-Based Large-Signal FET ..:

Martín-Guerrero, Teresa María ; Santarelli, Alberto ; Gibiino, Gian Piero...
T. M. Martín-Guerrero, A. Santarelli, G. P. Gibiino, P. A. Traverso, C. Camacho-Peñalosa and F. Filicori, "Automatic Extraction of Measurement-Based Large-Signal FET Models by Nonlinear Function Sampling," in IEEE Transactions on Microwave Theory and Techniques, vol. 68, no. 5, pp. 1627-1636, May 2020, doi:10.1109/TMTT.2020.2968886.. , 2023

Link: https://hdl.handle.net/10630/28032

RT Journal
T1 <Title>Automatic Extraction of Measurement-Based Large-Signal FET Models by Nonlinear Function Sampling</Title>

UL https://suche.suub.uni-bremen.de/peid=base-ftunivmalaga:oai:riuma.uma.es:10630_28032&Exemplar=1&LAN=DE
				
A1 Martín-Guerrero, Teresa María
A1 Santarelli, Alberto
A1 Gibiino, Gian Piero
A1 Traverso, Pier Andrea
A1 Camacho-Peñalosa, Carlos
A1 Filicori, Fabio
PB IEEE
YR 2023
K1 Transistores de efecto de campo
K1 Semiconductores
K1 Field-effect transistors (FETs)
K1 Gallium nitride (GaN)
K1 Large-signal measurements
K1 Nonlinear vector network analyzer (NVNA)
K1 Semiconductor device modeling
JF T. M. Martín-Guerrero, A. Santarelli, G. P. Gibiino, P. A. Traverso, C. Camacho-Peñalosa and F. Filicori, "Automatic Extraction of Measurement-Based Large-Signal FET Models by Nonlinear Function Sampling," in IEEE Transactions on Microwave Theory and Techniques, vol. 68, no. 5, pp. 1627-1636, May 2020, doi:10.1109/TMTT.2020.2968886.
LK http://dx.doi.org/https://hdl.handle.net/10630/28032
DO https://hdl.handle.net/10630/28032
SF ELIB - SuUB Bremen

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