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Relaxation-Time Modeling for NQS Phenomena Characterization..:
García Luque, Aarón
;
Martín-Guerrero, Teresa María
;
Mata-Contreras, Francisco Javier
The International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits. , 2023
Link:
https://hdl.handle.net/10630/28048
RT Journal T1 <Title>Relaxation-Time Modeling for NQS Phenomena Characterization in High-Frequency Diodes</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivmalaga:oai:riuma.uma.es:10630_28048&Exemplar=1&LAN=DE A1 García Luque, Aarón A1 Martín-Guerrero, Teresa María A1 Mata-Contreras, Francisco Javier YR 2023 K1 Procesos irreversibles K1 Diodos K1 Analizadores de redes eléctricas K1 Nonquasi-Static Phenomena K1 Varactor K1 Schottky Diode K1 Nonlinear Network Vector Analyzer JF The International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits LK http://dx.doi.org/https://hdl.handle.net/10630/28048 DO https://hdl.handle.net/10630/28048 SF ELIB - SuUB Bremen
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