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1 Ergebnisse
1
Characterizing crystalline defects in single nanoparticles ..:
Akinobu Niozu∗
;
Yoshiaki Kumagai
;
Toshiyuki Nishiyama
...
info:eu-repo/semantics/altIdentifier/pmid/32148855. , 2020
Link:
http://hdl.handle.net/2434/720976
RT Journal T1
Characterizing crystalline defects in single nanoparticles from angular correlations of single-shot diffracted X-rays
UL https://suche.suub.uni-bremen.de/peid=base-ftunivmilanoair:oai:air.unimi.it:2434_720976&Exemplar=1&LAN=DE A1 Akinobu Niozu∗ A1 Yoshiaki Kumagai A1 Toshiyuki Nishiyama A1 Hironobu Fukuzawa A1 Koji Motomura A1 Max Bucher A1 Kazuki Asa A1 Yuhiro Sato A1 Yuta Ito A1 Tsukasa Takanashi A1 Daehyun You A1 Taishi Ono A1 Yiwen Li A1 Edwin Kukk A1 Catalin Miron A1 Liviu Neagu A1 Carlo Callegari A1 Michele Di Fraia A1 Giorgio Rossi A1 Davide E. Galli A1 Tommaso Pincelli A1 Alessandro Colombo A1 Shigeki Owada A1 Kensuke Tono A1 Takashi Kameshima A1 Yasumasa Joti A1 Tetsuo Katayama A1 Tadashi Togashi A1 Makina Yabashi A1 Kazuhiro Matsuda A1 Kiyonobu Nagaya A1 Christoph Bostedtd A1 and Kiyoshi Ueda PB International Union of Crystallography YR 2020 K1 X-ray diffraction K1 X-ray scattering K1 structure determination K1 single nanoparticle K1 crystalline defect K1 XFEL K1 angular correlation K1 stacking faults K1 Settore FIS/03 - Fisica della Materia JF info:eu-repo/semantics/altIdentifier/pmid/32148855 LK http://hdl.handle.net/2434/720976 DO http://hdl.handle.net/2434/720976 SF ELIB - SuUB Bremen
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