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1 Ergebnisse
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Failure Physics and Reliability of GaN-Based HEMTs for Micr..:
Zanoni E
;
Rampazzo F
;
De Santi C
...
info:eu-repo/semantics/altIdentifier/wos/WOS:000889904800001. , 2022
Link:
https://hdl.handle.net/11380/1295218
RT Journal T1 <Title>Failure Physics and Reliability of GaN-Based HEMTs for Microwave and Millimeter-Wave Applications: A Review of Consolidated Data and Recent Results</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivmodena:oai:iris.unimore.it:11380_1295218&Exemplar=1&LAN=DE A1 Zanoni E A1 Rampazzo F A1 De Santi C A1 Gao Z A1 Sharma C A1 Modolo N A1 Verzellesi G A1 Chini A A1 Meneghesso G A1 Meneghini M YR 2022 K1 degradation K1 failure mechanism K1 gallium nitride K1 HEMT K1 microwave K1 millimeter-wave K1 reliability JF info:eu-repo/semantics/altIdentifier/wos/WOS:000889904800001 LK http://dx.doi.org/https://hdl.handle.net/11380/1295218 DO https://hdl.handle.net/11380/1295218 SF ELIB - SuUB Bremen
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