I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Microwave and Millimeter-Wave GaN HEMTs: Impact of Epitaxia..:
Zanoni, Enrico
;
Santi, Carlo De
;
Gao, Zhan
...
info:eu-repo/semantics/altIdentifier/wos/WOS:001087462000001. , 2024
Link:
https://hdl.handle.net/11380/1320426
RT Journal T1
Microwave and Millimeter-Wave GaN HEMTs: Impact of Epitaxial Structure on Short-Channel Effects, Electron Trapping, and Reliability
UL https://suche.suub.uni-bremen.de/peid=base-ftunivmodena:oai:iris.unimore.it:11380_1320426&Exemplar=1&LAN=DE A1 Zanoni, Enrico A1 Santi, Carlo De A1 Gao, Zhan A1 Buffolo, Matteo A1 Fornasier, Mirko A1 Saro, Marco A1 Pieri, Francesco De A1 Rampazzo, Fabiana A1 Meneghesso, Gaudenzio A1 Meneghini, Matteo A1 Zagni, Nicolo' A1 Chini, Alessandro A1 Verzellesi, Giovanni YR 2024 K1 Aluminum gallium nitride K1 Deep level K1 electron device failure physic K1 Gallium nitride K1 gallium nitride high-electron-mobility transistors (GaN HEMT) K1 HEMT scaling K1 HEMT K1 Logic gate K1 Microwave transistor K1 millimeter wave K1 reliability K1 short-channel effect K1 Silicon K1 Wide band gap semiconductor JF info:eu-repo/semantics/altIdentifier/wos/WOS:001087462000001 LK http://dx.doi.org/https://hdl.handle.net/11380/1320426 DO https://hdl.handle.net/11380/1320426 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)