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1 Ergebnisse
1
Sequential focused ion beam scanning electron microscopy an..:
Vanpeene, Victor
;
Soucy, Patrick
;
Xiong, Jianhan
...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.jpowsour.2021.229904. , 2021
Link:
https://hal.science/hal-03266337
RT Journal T1 <Title>Sequential focused ion beam scanning electron microscopy analyses for monitoring cycled-induced morphological evolution in battery composite electrodes. Silicon-graphite electrode as exemplary case</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivnantes:oai:HAL:hal-03266337v1&Exemplar=1&LAN=DE A1 Vanpeene, Victor A1 Soucy, Patrick A1 Xiong, Jianhan A1 Dupré, Nicolas A1 Lestriez, Bernard A1 Roué, Lionel PB HAL CCSD; Elsevier YR 2021 K1 [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci] JF info:eu-repo/semantics/altIdentifier/doi/10.1016/j.jpowsour.2021.229904 LK http://dx.doi.org/https://hal.science/hal-03266337 DO https://hal.science/hal-03266337 SF ELIB - SuUB Bremen
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