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1 Ergebnisse
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Characterization of charge trapping mechanisms in GaN verti..:
Ruzzarin M
;
De Santi C
;
Chiocchetta F
...
info:eu-repo/semantics/altIdentifier/wos/WOS:000503907900095. , 2019
Link:
http://hdl.handle.net/11577/3329671
RT Journal T1 <Title>Characterization of charge trapping mechanisms in GaN vertical Fin FETs under positive gate bias</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivpadovairis:oai:www.research.unipd.it:11577_3329671&Exemplar=1&LAN=DE A1 Ruzzarin M A1 De Santi C A1 Chiocchetta F A1 Sun M A1 Palacios T A1 Zanoni E A1 Meneghesso G A1 Meneghini M PB Elsevier Ltd YR 2019 JF info:eu-repo/semantics/altIdentifier/wos/WOS:000503907900095 LK http://hdl.handle.net/11577/3329671 DO http://hdl.handle.net/11577/3329671 SF ELIB - SuUB Bremen
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