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Analysis of defects and physical mechanisms that limit the ..:
Vaccari, Simone
numberofpages:251. , 2014
Link:
http://hdl.handle.net/11577/3423829
RT Journal T1
Analysis of defects and physical mechanisms that limit the ESD robustness of Light Emitting Diodes
UL https://suche.suub.uni-bremen.de/peid=base-ftunivpadovairis:oai:www.research.unipd.it:11577_3423829&Exemplar=1&LAN=DE A1 Vaccari, Simone PB Università degli studi di Padova YR 2014 K1 Difetti K1 robustezza ESD K1 scariche elettrostatiche K1 LED K1 Diodi emettitori di luce. Defects K1 ESD robustness K1 electrostatic discharges K1 Light-emitting diodes K1 Settore ING-INF/01 - Elettronica JF numberofpages:251 LK http://hdl.handle.net/11577/3423829 DO http://hdl.handle.net/11577/3423829 SF ELIB - SuUB Bremen
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