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1 Ergebnisse
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Defects in III-N LEDs: experimental identification and impa..:
Buffolo M
;
Roccato N
;
Piva F
...
info:eu-repo/semantics/altIdentifier/isbn/9781510649156. , 2022
Link:
https://hdl.handle.net/10447/593621
RT Journal T1 <Title>Defects in III-N LEDs: experimental identification and impact on electro-optical characteristics</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivpalermo:oai:iris.unipa.it:10447_593621&Exemplar=1&LAN=DE A1 Buffolo M A1 Roccato N A1 Piva F A1 De Santi C A1 Brescancin R A1 Casu C A1 Caria A A1 Mukherjee K A1 Haller C A1 Carlin J. F A1 Grandjean N A1 Vallone M A1 Tibaldi A A1 Bertazzi F A1 Goano M A1 Verzellesi G A1 Mosca M A1 Meneghesso G A1 Zanoni E A1 Meneghini M PB SPIE-INT SOC OPTICAL ENGINEERING; country:US; place:1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA YR 2022 K1 Gallium nitride K1 defects K1 indium K1 reliability K1 trap-assisted tunneling K1 Settore ING-INF/01 - Elettronica JF info:eu-repo/semantics/altIdentifier/isbn/9781510649156 LK http://dx.doi.org/https://hdl.handle.net/10447/593621 DO https://hdl.handle.net/10447/593621 SF ELIB - SuUB Bremen
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