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1 Ergebnisse
1
NVM cell degradation induced by femtosecond laser backside ..:
Della Marca, V
;
Chambonneau, M
;
Souiki-Figuigui, S
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS.2016.7574580. , 2016
Link:
https://hal.science/hal-01418479
RT Journal T1 <Title>NVM cell degradation induced by femtosecond laser backside irradiation for reliability tests</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivphautsdefr:oai:HAL:hal-01418479v1&Exemplar=1&LAN=DE A1 Della Marca, V A1 Chambonneau, M A1 Souiki-Figuigui, S A1 Postel-Pellerin, J A1 Canet, P A1 Chiquet, P A1 Kussener, Edith A1 Yengui, F A1 Wacquez, R A1 Grojo, D A1 Portal, Jean-Michel A1 Lisart, M PB HAL CCSD YR 2016 K1 [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic JF info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS.2016.7574580 LK http://dx.doi.org/https://hal.science/hal-01418479 DO https://hal.science/hal-01418479 SF ELIB - SuUB Bremen
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