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Bias Dependence of the Electrical Spin Injection into GaAs ..:

Barate, Philippe ; Liang, S. h., H ; Zhang, Tiantian...
info:eu-repo/semantics/altIdentifier/doi/10.1103/physrevapplied.8.054027. , 2017

Link: https://hal.univ-lorraine.fr/hal-02011572

RT Journal
T1 <Title>Bias Dependence of the Electrical Spin Injection into GaAs from Co − Fe − B / MgO Injectors with Different MgO Growth Processes</Title>

UL https://suche.suub.uni-bremen.de/peid=base-ftunivrennes1hal:oai:HAL:hal-02011572v1&Exemplar=1&LAN=DE
				
A1 Barate, Philippe
A1 Liang, S. h., H
A1 Zhang, Tiantian
A1 Frougier, J
A1 Xu, B
A1 Schieffer, Philippe
A1 Vidal, M
A1 Jaffres, H
A1 Lépine, B
A1 Tricot, Sylvain
A1 Cadiz, Fabian
A1 Garandel, Thomas
A1 George, J., M
A1 Amand, Thierry
A1 Devaux, X
A1 Hehn, M
A1 Mangin, S
A1 Tao, B
A1 Han, X, F
A1 Wang, Z. G
A1 Marie, Xavier
A1 Lu, Y
A1 Renucci, Pierre
PB HAL CCSD; American Physical Society
YR 2017
K1 Tunnel junctions
K1 Magnetic tunnel junctions
K1 Junctions
K1 Applications of soft matter
K1 [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat]
K1 [SPI.TRON]Engineering Sciences [physics]/Electronics
JF info:eu-repo/semantics/altIdentifier/doi/10.1103/physrevapplied.8.054027
LK http://dx.doi.org/https://hal.univ-lorraine.fr/hal-02011572
DO https://hal.univ-lorraine.fr/hal-02011572
SF ELIB - SuUB Bremen

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