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1 Ergebnisse
1
Nanoscale residual stress depth profiling by Focused Ion Be..:
Korsunsky, A. M
;
Salvati, E
;
Lunt, A. G. J
...
info:eu-repo/semantics/altIdentifier/wos/WOS:000428122900006. , 2018
Link:
http://hdl.handle.net/11590/330970
RT Journal T1 <Title>Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivroma3iris:oai:iris.uniroma3.it:11590_330970&Exemplar=1&LAN=DE A1 Korsunsky, A. M A1 Salvati, E A1 Lunt, A. G. J A1 Sui, T A1 Mughal, M. Z A1 Daniel, R A1 Keckes, J A1 Bemporad, E A1 Sebastiani, M YR 2018 K1 Depth profiling K1 Eigenstrain K1 FIB-DIC ring core K1 Nano resolution K1 Residual stre K1 XRD K1 Materials Science (all) K1 Mechanics of Material K1 Mechanical Engineering JF info:eu-repo/semantics/altIdentifier/wos/WOS:000428122900006 LK http://hdl.handle.net/11590/330970 DO http://hdl.handle.net/11590/330970 SF ELIB - SuUB Bremen
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