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1 Ergebnisse
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Thorough investigation of Si-nanocrystal memories with high..:
Molas, G
;
Bocquet, Marc
;
Buckley, J
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IEDM.2007.4418971. , 2007
Link:
https://hal.science/hal-02072903
RT Journal T1 <Title>Thorough investigation of Si-nanocrystal memories with high-k interpoly dielectrics for sub-45nm node Flash NAND applications</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivsavoie:oai:HAL:hal-02072903v1&Exemplar=1&LAN=DE A1 Molas, G A1 Bocquet, Marc A1 Buckley, J A1 Colonna, J., P A1 Masarotto, L A1 Grampeix, H A1 Martin, F A1 Vidal, V A1 Toffoli, A A1 Brianceau, P A1 Vermande, L A1 Scheiblin, P A1 Gély, M A1 Papon, A A1 Auvert, G A1 Perniola, L A1 Licitra, C A1 Veyron, T A1 Rochat, N A1 Bongiorno, C A1 Lombardo, S A1 de Salvo, B A1 Deleonibus, S PB HAL CCSD; IEEE YR 2007 K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF info:eu-repo/semantics/altIdentifier/doi/10.1109/IEDM.2007.4418971 LK http://dx.doi.org/https://hal.science/hal-02072903 DO https://hal.science/hal-02072903 SF ELIB - SuUB Bremen
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