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1 Ergebnisse
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Thorough investigation of low frequency noise mechanisms in..:
Kammeugne, R. Kom
;
Theodorou, Christoforos
;
Leroux, C
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IEDM19574.2021.9720522. , 2021
Link:
https://hal.science/hal-03762149
RT Journal T1 <Title>Thorough investigation of low frequency noise mechanisms in AlGaN/GaN and Al$_2$O$_3$/GaN HEMTs</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivsavoie:oai:HAL:hal-03762149v1&Exemplar=1&LAN=DE A1 Kammeugne, R. Kom A1 Theodorou, Christoforos A1 Leroux, C A1 Mescot, X A1 Vauche, L A1 Gwoziecki, R A1 Becu, S A1 Charles, M A1 Bano, E A1 Ghibaudo, G PB HAL CCSD; IEEE YR 2021 K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics K1 [SPI.TRON]Engineering Sciences [physics]/Electronics JF info:eu-repo/semantics/altIdentifier/doi/10.1109/IEDM19574.2021.9720522 LK http://dx.doi.org/https://hal.science/hal-03762149 DO https://hal.science/hal-03762149 SF ELIB - SuUB Bremen
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