I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Static and LFN/RTN Local and Global Variability Analysis Us..:
Gauthier, Owen
;
Haendler, Sébastien
;
Beucher, Ronan
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ICMTS55420.2023.10094087. , 2023
Link:
https://hal.science/hal-04305404
RT Journal T1 <Title>Static and LFN/RTN Local and Global Variability Analysis Using an Addressable Array Test Structure</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivsavoie:oai:HAL:hal-04305404v1&Exemplar=1&LAN=DE A1 Gauthier, Owen A1 Haendler, Sébastien A1 Beucher, Ronan A1 Scheer, Patrick A1 Rafhay, Quentin A1 Theodorou, Christoforos PB HAL CCSD; IEEE YR 2023 K1 matching low frequency noise Random Telegraph Noise variability addressable test structure statistical analysis K1 matching K1 low frequency noise K1 Random Telegraph Noise K1 variability K1 addressable test structure K1 statistical analysis K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF info:eu-repo/semantics/altIdentifier/doi/10.1109/ICMTS55420.2023.10094087 LK http://dx.doi.org/https://hal.science/hal-04305404 DO https://hal.science/hal-04305404 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
