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In situ monitoring of thin alumina passive film growth by s..:

Dutems, Julie ; Crespo-Monteiro, Nicolas ; Faverjon, F...
info:eu-repo/semantics/altIdentifier/doi/10.1038/s41598-024-64378-w. , 2024

Link: https://hal.science/hal-04618452

RT Journal
T1 <Title>In situ monitoring of thin alumina passive film growth by surface plasmon resonance (SPR) during an electrochemical process</Title>

UL https://suche.suub.uni-bremen.de/peid=base-ftunivstetienne:oai:HAL:hal-04618452v1&Exemplar=1&LAN=DE
				
A1 Dutems, Julie
A1 Crespo-Monteiro, Nicolas
A1 Faverjon, F
A1 Gâté, V
A1 Turover, D
A1 Joly Marcelin, Sabrina
A1 Ter-Ovanessian, Benoît
A1 Héau, C
A1 Verrier, I
A1 Normand, Bernard
A1 Jourlin, Yves
PB HAL CCSD; Nature Publishing Group
YR 2024
K1 gratings
K1 Surface Plasmon
K1 Thin films
K1 Electrochemical Impedance Spectroscopic
K1 Electrochemical process
K1 Optical properties
K1 [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]
K1 [PHYS.PHYS.PHYS-CHEM-PH]Physics [physics]/Physics [physics]/Chemical Physics [physics.chem-ph]
K1 [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]
JF info:eu-repo/semantics/altIdentifier/doi/10.1038/s41598-024-64378-w
LK http://dx.doi.org/https://hal.science/hal-04618452
DO https://hal.science/hal-04618452
SF ELIB - SuUB Bremen

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