I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Crystallographic phase changes and damage thresholds of CsP..:
Kieran O Russell
;
Mark Osborne
;
Aidan Fisher
10779/uos.23307137.v1. , 2020
Link:
https://figshare.com/articles/journal_contribution/Cry..
RT Journal T1
Crystallographic phase changes and damage thresholds of CsPbI3 microwire waveguides through continuous wave photoablation
UL https://suche.suub.uni-bremen.de/peid=base-ftunivsussexfig:oai:figshare.com:article_23307137&Exemplar=1&LAN=DE A1 Kieran O Russell A1 Mark Osborne A1 Aidan Fisher YR 2020 K1 perovskites K1 optical nanomaterials K1 waveguides K1 laser ablation K1 photodegradation JF 10779/uos.23307137.v1 LK http://dx.doi.org/https://figshare.com/articles/journal_contribution/Crystallographic_phase_changes_and_damage_thresholds_of_CsPbI3_microwire_waveguides_through_continuous_wave_photoablation/23307137 DO https://figshare.com/articles/journal_contribution/Crystallographic_phase_changes_and_damage_thresholds_of_CsPbI3_microwire_waveguides_through_continuous_wave_photoablation/23307137 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)