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1 Ergebnisse
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Nanoscale Estimation of Coating Thickness on Substrates via..:
Skoupý, Radim
;
Fořt, Tomáš
;
Krzyžánek, Vladislav
Nanomaterials. , 2020
Link:
http://hdl.handle.net/11012/195942
RT Journal T1
Nanoscale Estimation of Coating Thickness on Substrates via Standardless BSE Detector Calibration
UL https://suche.suub.uni-bremen.de/peid=base-ftunivtbrno:oai:dspace.vutbr.cz:11012_195942&Exemplar=1&LAN=DE A1 Skoupý, Radim A1 Fořt, Tomáš A1 Krzyžánek, Vladislav PB MDPI YR 2020 K1 SEM K1 quantitative imaging K1 back-scattered electrons K1 standardless calibration K1 electron mirror K1 sample bias K1 Monte Carlo simulation K1 thin coating layers JF Nanomaterials LK http://hdl.handle.net/11012/195942 DO http://hdl.handle.net/11012/195942 SF ELIB - SuUB Bremen
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