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1 Ergebnisse
1
Nanoelectronic COupled problems solutions - nanoCOPS: model..:
ter Maten, E Jan W
;
Putek, Piotr
;
Gunther, Michael
...
Journal of Mathematics in Industry. , 2016
Link:
http://hdl.handle.net/11012/65333
RT Journal T1
Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation
UL https://suche.suub.uni-bremen.de/peid=base-ftunivtbrno:oai:dspace.vutbr.cz:11012_65333&Exemplar=1&LAN=DE A1 ter Maten, E Jan W A1 Putek, Piotr A1 Gunther, Michael A1 Pulch, Roland A1 Tischendorf, Caren A1 Strohm, Christian A1 Schoenmaker, Wim A1 Meuris, Peter A1 De Smedt, Bart A1 Benner, Peter A1 Feng, Lihong A1 Banagaaya, Nicodemus A1 Yue, Yao A1 Janssen, Rick A1 J Dohmen, Jos A1 Tasić, Bratislav A1 Deleu, Frederik A1 Gillon, Renaud A1 Wieers, Aarnout A1 Brachtendorf, Hans-Georg A1 Bittner, Kai A1 Kratochvíl, Tomáš A1 Petržela, Jiří A1 Šotner, Roman A1 Götthans, Tomáš A1 Dřínovský, Jiří A1 Schöps, Sebastian A1 J Duque Guerra, David A1 Casper, Thorben A1 De Gersem, Herbert A1 Römer, Ulrich A1 Reynier, Pascal A1 Barroul, Patrice A1 Masliah, Denis A1 Rousseau, Benoît YR 2016 K1 multirate K1 model order reduction K1 co-simulation K1 uncertainty K1 quantification K1 power-MOS devices K1 RF-circuitry K1 bond wires K1 coupled problems K1 multiphysics K1 fault simulation JF Journal of Mathematics in Industry LK http://hdl.handle.net/11012/65333 DO http://hdl.handle.net/11012/65333 SF ELIB - SuUB Bremen
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