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1 Ergebnisse
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Temperature impact (up to 200°C) on performance and reliabi..:
Cabout, T
;
Perniola, L
;
Jousseaume, V
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IMW.2013.6582112. , 2013
Link:
https://hal.science/hal-01738426
RT Journal T1 <Title>Temperature impact (up to 200°C) on performance and reliability of HfO2-based RRAMs</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivtoulon:oai:HAL:hal-01738426v1&Exemplar=1&LAN=DE A1 Cabout, T A1 Perniola, L A1 Jousseaume, V A1 Grampeix, H A1 Nodin, J.F A1 Toffoli, A A1 Guillermet, M A1 Jalaguier, E A1 Vianello, E A1 Molas, G A1 Reimbold, G A1 de Salvo, B A1 Diokh, T A1 Candelier, P A1 Pirrotta, O A1 Padovani, A A1 Larcher, L A1 Bocquet, Marc A1 Muller, Christophe PB HAL CCSD; IEEE YR 2013 K1 bipolar operation K1 endurance K1 data retention K1 Resistive-switching random access memory (RRAM) K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF info:eu-repo/semantics/altIdentifier/doi/10.1109/IMW.2013.6582112 LK http://dx.doi.org/https://hal.science/hal-01738426 DO https://hal.science/hal-01738426 SF ELIB - SuUB Bremen
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