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1 Ergebnisse
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Radiation hardening efficiency of gate sizing and transisto..:
Aguiar, Y.Q
;
Wrobel, Frédéric
;
Guagliardo, S
...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2019.113457. , 2019
Link:
https://hal.science/hal-02515096
RT Journal T1 <Title>Radiation hardening efficiency of gate sizing and transistor stacking based on standard cells</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivtoulon:oai:HAL:hal-02515096v1&Exemplar=1&LAN=DE A1 Aguiar, Y.Q A1 Wrobel, Frédéric A1 Guagliardo, S A1 Autran, J.-L A1 Leroux, P A1 Saigné, F A1 Touboul, A.D., D A1 Pouget, V PB HAL CCSD; Elsevier YR 2019 K1 [SPI.TRON]Engineering Sciences [physics]/Electronics JF info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2019.113457 LK http://dx.doi.org/https://hal.science/hal-02515096 DO https://hal.science/hal-02515096 SF ELIB - SuUB Bremen
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