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1 Ergebnisse
1
New Modelling Off-state TDDB for 130nm to 28nm CMOS nodes:
Garba-Seybou, Tidjani
;
Federspiel, Xavier
;
Bravaix, Alain
.
info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS48227.2022.9764431. , 2022
Link:
https://hal.science/hal-03659269
RT Journal T1 <Title>New Modelling Off-state TDDB for 130nm to 28nm CMOS nodes</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivtoulon:oai:HAL:hal-03659269v1&Exemplar=1&LAN=DE A1 Garba-Seybou, Tidjani A1 Federspiel, Xavier A1 Bravaix, Alain A1 Cacho, Florian PB HAL CCSD; IEEE YR 2022 K1 CMOS K1 off-state damage K1 aging K1 TDDB K1 gate oxide breakdown K1 leakage current K1 [SPI]Engineering Sciences [physics] JF info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS48227.2022.9764431 LK http://dx.doi.org/https://hal.science/hal-03659269 DO https://hal.science/hal-03659269 SF ELIB - SuUB Bremen
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