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Preliminary Study of Electronics Reliability in ITER Neutro..:

Dentan, Martin ; Borgese, Gianluca ; Autran, Jean-Luc...
info:eu-repo/semantics/altIdentifier/doi/10.1109/RADECS55911.2022.10412483. , 2022

Link: https://amu.hal.science/hal-03735989

RT Journal
T1 <Title>Preliminary Study of Electronics Reliability in ITER Neutron Environment</Title>

UL https://suche.suub.uni-bremen.de/peid=base-ftunivtoulon:oai:HAL:hal-03735989v1&Exemplar=1&LAN=DE
				
A1 Dentan, Martin
A1 Borgese, Gianluca
A1 Autran, Jean-Luc
A1 Munteanu, Daniela
A1 Moindjie, Soilihi
A1 Moreau, Philippe
A1 Pellissier, Francis-Pierre
A1 Santraine, Benjamin
A1 Bucalossi, Jérôme
A1 Roche, Philippe
A1 Malherbe, Victor
A1 Cecchetto, Matteo
A1 Rubén, García Alía
PB HAL CCSD
YR 2022
K1 CMOS
K1 deuterium-deuterium (D-D)
K1 deuterium-tritium (D-T)
K1 fusion
K1 neutron
K1 real-time experiment
K1 single event effects (SEE)
K1 single-event upset
K1 static random access memory (SRAM)
K1 tokamak
K1 ITER
K1 WEST
K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
JF info:eu-repo/semantics/altIdentifier/doi/10.1109/RADECS55911.2022.10412483
LK http://dx.doi.org/https://amu.hal.science/hal-03735989
DO https://amu.hal.science/hal-03735989
SF ELIB - SuUB Bremen

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