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1 Ergebnisse
1
Reliability Study of 130nm CMOS technology submitted to hot..:
Di Gilio, Thierry
tel-00117263. , 2006
Link:
https://theses.hal.science/tel-00117263
RT Journal T1
Reliability Study of 130nm CMOS technology submitted to hot carrier injections ; Etude de la fiabilité porteurs chauds et des performances des technologies CMOS 0.13 μm - 2nm
UL https://suche.suub.uni-bremen.de/peid=base-ftunivtoulon:oai:HAL:tel-00117263v2&Exemplar=1&LAN=DE A1 Di Gilio, Thierry PB HAL CCSD YR 2006 K1 MOSFET K1 transistor K1 impact ionisation K1 hot carriers K1 direct tunnel current K1 interface states K1 charge trapping K1 transistor aging K1 lifetime K1 Transistors MOSFET K1 Ionisation par impact K1 Porteurs chauds K1 Courant tunnel direct K1 Etats d'interface K1 Piégeage de charges K1 Vieillissement K1 Durée de vie K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF tel-00117263 LK http://dx.doi.org/https://theses.hal.science/tel-00117263 DO https://theses.hal.science/tel-00117263 SF ELIB - SuUB Bremen
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