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1 Ergebnisse
1
On-Chip Noise Sensor for Integrated Circuit Susceptibility ..:
Ben Dhia, Sonia
;
Boyer, Alexandre
;
Vrignon, Bertrand
..
info:eu-repo/semantics/altIdentifier/doi/10.1109/TIM.2011.2172116. , 2012
Link:
https://hal.science/hal-00668627
RT Journal T1
On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations
UL https://suche.suub.uni-bremen.de/peid=base-ftunivtoulouse2:oai:HAL:hal-00668627v1&Exemplar=1&LAN=DE A1 Ben Dhia, Sonia A1 Boyer, Alexandre A1 Vrignon, Bertrand A1 Deobarro, Mikael A1 Than Vinh, Dinh PB HAL CCSD; Institute of Electrical and Electronics Engineers YR 2012 K1 Electromagnetic compatibility K1 integrated circuits K1 on-chip sensor K1 susceptibility testing K1 interference measurement K1 [SPI.TRON]Engineering Sciences [physics]/Electronics JF info:eu-repo/semantics/altIdentifier/doi/10.1109/TIM.2011.2172116 LK http://dx.doi.org/https://hal.science/hal-00668627 DO https://hal.science/hal-00668627 SF ELIB - SuUB Bremen
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