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1 Ergebnisse
1
Over-Voltage and Cross-Conduction Hard Switching Stress on ..:
Ghizzo, Lucien
;
Trémouilles, David
;
Richardeau, Frédéric
...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2023.115172. , 2023
Link:
https://hal.science/hal-04252379
RT Journal T1 <Title>Over-Voltage and Cross-Conduction Hard Switching Stress on Schottky Gate-Type p-GaN HEMT in Half-Bridge Operation Experimental and Physical Approaches [ESREF'23]</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivtoulouse2:oai:HAL:hal-04252379v1&Exemplar=1&LAN=DE A1 Ghizzo, Lucien A1 Trémouilles, David A1 Richardeau, Frédéric A1 Vinnac, Sébastien A1 Jamin, François A1 Guibaud, Gérald PB HAL CCSD YR 2023 K1 HEMT GaN K1 Reliability K1 Robustness K1 Overvoltage stress K1 Cross-Conduction K1 Hard-Switching stress K1 [SPI.NRJ]Engineering Sciences [physics]/Electric power K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2023.115172 LK http://dx.doi.org/https://hal.science/hal-04252379 DO https://hal.science/hal-04252379 SF ELIB - SuUB Bremen
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