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Characterization of geen laser crystallized GeSi thin films:
Rangarajan, Balaji
;
Brunets, Ihor
;
Oesterlin, Peter
.
http://doc.utwente.nl/102672/1/Balaji_Rangarajan_MRS_paper_Spring_2011.pdf. , 2011
Link:
http://purl.utwente.nl/publications/102672
RT Journal T1 <Title>Characterization of geen laser crystallized GeSi thin films</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftunivtwente:oai:doc.utwente.nl:102672&Exemplar=1&LAN=DE A1 Rangarajan, Balaji A1 Brunets, Ihor A1 Oesterlin, Peter A1 Kovalgin, Alexey Y PB Cambridge University Press YR 2011 JF http://doc.utwente.nl/102672/1/Balaji_Rangarajan_MRS_paper_Spring_2011.pdf LK http://purl.utwente.nl/publications/102672 DO http://purl.utwente.nl/publications/102672 SF ELIB - SuUB Bremen
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